EXHIBITOR
FISCHERSCOPE® X-RAY XAN® 500
HELMUT FISCHER SRL
About the product
Compact XRF instrument with an SDD detector for non-destructive coating thickness measurement and material composition analysis. It provides accurate and precise results even with short measuring times and complex multilayer systems.
Categories
INSTRUMENTS AND TOOLS FOR GOLDSMITHING AND JEWELRY
Measuring and control instruments Analytical instruments
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